KẾT QUẢ TÌM KIẾM Hướng dẫn

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  Hysitron PI 89 SEM PicoIndenter Technology

  Robust, precise and modular in-situ SEM nanomechanical instrument
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  SEM chamberscope Technology

  Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination.

  The chamberscope can be mounted on any available free port, even one not directly in line with the centre of the column. There is a choice of wide angle or zoom lenses which are user interchangable.

  Systems are available with or without TFT monitors and with optional USB control and image display.

  Deben chamberscopes are available for all SEM makes, contact us for a quotation and to check compatibility on your SEM.
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  Motorised aperture holder for SEM Technology

  Deben can offer a motorised aperture drive for many SEM columns including JEOL JSM-5400/5600/6360, JSM5800/5900/6460 JSM-840, 6300, 6400, JXA-8600 and JXA-8900.
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  Real-time 3D analytical FIB-SEM NX9000 Technology

  The newly developed FIB-SEM system from Hitachi, the NX9000 incorporates an optimized layout for true high resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM analysis. The NX9000 FIB-SEM system allows the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues and a multitude of other applications.
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  Gen5 Retractable Bright & Dark Field SEM STEM Detector Technology

  A maximum of twelve 3mm grids can be fitted to the STEM grid holder, allowing multiple specimen analysis. A dedicated retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM (suitable free chamber port and AUX video input required). The 12 position grid holder is airlock compatible and is supplied complete with stage dovetail/sledge as required.
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  SEM Laser stage Technology

  The Deben laser stage incorporates an XY grid based laser encoder system, which is extremely stable and easy to align. This type of encoder system automatically compensates for rotational error which is normally present when using separate X and Y reading heads.
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  Hitachi Spherical Aberration Corrected STEM/SEM HD-2700 Technology

  Cs-corrected high-resolution imaging & high-sensitivity analysis with unmatched throughput.
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  Sprite SEM & TEM stage motorisation Technology

  SPRITE stage automation systems are available for all makes and models of electron microscope.

  Systems comprise joystick controller, microprocessor controlled electronics and two to five SPRITE motor drive units.
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  QUANTAX EBSD ELECTRON MICROSCOPE ANALYZERS Technology

  QUANTAX EBSD system with its popular OPTIMUS 2 detector head is the best available solution for analyzing nanomaterials in the SEM
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  SEM Backscatter Detector (BSE), 4 quadrant Technology

  Built on 30 years of backscatter electron detector experience the microprocessor controlled Gen5 electronics offers unrivalled speed, sensitivity and low noise.