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Hysitron PI 89 SEM PicoIndenter

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Code: #22220

Robust, precise and modular in-situ SEM nanomechanical instrument

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The Hysitron PI 89 SEM PicoIndenter leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIBSEM, PFIB), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. PI 89 further advances Bruker's market-leading capacitive transducer technology, which enabled the first commercial in-situ SEM nanomechanics platforms. Enabled testing techniques include nanoindentation, tensile testing, pillar compression, particle compression, cantilever bending, fracture, fatigue, dynamic testing, and mechanical properties mapping.

The compact design of Hysitron PI 89 allows for maximum stage tilt and minimum working distance to enable optimal imaging during testing. PI 89 offers researchers greater versatility and performance than competing systems:
- Redesigned platform increases versatility and ease of use
- 1 nm encoded linear stages provide greater repeatability during automated testing modes while increasing travel range
- Improved frame stiffness (~0.9 x 106 N/m) delivers greater stability throughout the testing process
- Rotation and tilt (RT) stage configurations enable imaging, FIB milling, and access to detectors, such as EDS, CBD, EBSD, and TKD for analytical data and imaging

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