With its unique and innovative design, the Bettersizer S3 Plus
combines the measurement methods of static light scattering and dynamic
image analysis, thus offering a universal option for characterizing
size and shape of particles from the nanometer to the millimeter range.
Using the patented DLOIOS technology, even nanoparticles (from 10 nm
onward) can reliably be characterized. The additional lens between the
laser and the measurement chamber enables the detection of the
backscattered light. The use of only one laser with oblique incidence of
light provides a continuous scattering spectrum with consistent
wavelength and allows the detection in a continuous angle range up to
Since the maximal intensity of the scattered light of large particles
can only be detected at very small angles, the classical static light
scattering cannot analyze those particles sufficient enough. The image
analysis system of the Bettersizer S3 Plus enables, in
contrast to other laser diffraction systems, the reliable detection of
larger particles thanks to particle detection by camera and thus allows
realistic measurements up to 3.5 mm.
Thanks to the implemented dynamic image analysis, the most important
shape parameters can be calculated from the individual particle images –
aspect ratio, circularity, sharpness of edges, and others.
The shape analysis can be carried out simultaneously with the size
analysis or independently. Thereby you can choose between two
magnifications for image collection (0.5X and 10X).