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Jasco V-7000 Series Absolut Reflectance Measurement System

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Code: #14412

Supplier: JASCO International Co., Ltd.

The absolute reflectance measurement system automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films and various optical elements.

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rightMORE INFORMATION

  • - PC control of instrument conditions such as incidence and collection angles and spectrum measurement parameters.
    - Wide range of instrument wavelengths, from the ultraviolet to near infrared region.
    - Superior photometric stability using double-beam optical configuration.
    - Individual control of incidence and collection angles.
    - Standard polarization measurement capability.
    - Purpose-built sample holder simplifies loading/removal of samples.

  • Wavelength range:

    230nm to 850nm (ARV-701)
    230nm to 2200nm (ARV-702)
    230nm to 1650nm (ARV-703)

    Incident angle:

    5° to 60° (Reflectance mode)
    0° to 60° (Trancemittance mode)

    Sample dimensions:

    Minimum 20(H) x 20(W) x 0.5(T) mm
    Maximum 70(H) x 100(W) x 10(T) mm

    Detectors

    PMT (all models),
    PbS (ARV-702),
    InGaAs (ARV-703)

 

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