State-of-the-art XRD² solutions enable data collection in both 2Theta and Gamma direction to provide additional information about the properties of crystalline samples.
Rely on expert XRD solutions for measuring stress and texture in machined parts, bulk and thin film samples.
Extract structural information by applying X-Ray Powder Diffraction (XRPD) including Rietveld (TOPAS) analysis, diffuse or "total" scattering (PDF analysis), and Small Angle X-Ray Scattering (SAXS).