1. Ease of Use: Compact and portable with incredibly simple operation
Tabletop installation
The space-saving and lightweight TM3030 can be conveniently installed on a tabletop*. No cooling water is needed, so installation is quick and easy and requires only a standard 100-240 V AC power supply.
*:requires a table capable of supporting 100 kg.
Comprehensive auto-functions, with one-click “Start”
Imaging with the TM3030 couldn’t be simpler. Pressing the “Start” button automatically turns on the beam, adjusts focus, brightness and contrast, as well as displays the image at an easy-to-view starting magnification of x100.
2. No Sample Preparation Necessary: Versatile with a wide magnification range and multiple operating conditions
Image non-conducting specimens with ease
When a non-conductive sample is observed with a high-vacuum SEM, electrons accumulate on the specimen surface causes charge-up, preventing imaging. In order to avoid the charge-up damage, the sample is usually coated with a thin layer of metal prior to observation. This process is not only time-consuming, but also interferes with optical imaging of surface details as well as EDX analysis. The TM3030 overcomes this problem with “charge-up reduction mode.” This mode uses low-vacuum functionality to dissipate the charge.
Low-vacuum microscopy
By utilizing a low vacuum level inside the specimen chamber, more gas molecules are present. These gas molecules "G" can collide with the electron beam to generate positive ions "+" and electrons "e". Each positive ion "+" can be neutralized by one of the excess electrons "-" on the specimen surface. In this way the excess electrons on the surface of the sample are removed and the charge-up effect is eliminated or reduced.
3. Unparalleled Image Quality: Enhanced image resolution for surface details
5 kV mode
The 5 kV accelerating voltage allows observation of surface details. It offers not only traditional topographic imaging, but also compositional imaging information. The 5 kV observation condition is further enhanced throughout high magnifications by improving the electron optics.
Enhanced sharpness & contrast capability
These functions will be utilized to enhance image quality at any observation condition modes and will be very effective for high-magnification specimens.
4. Innovative premium SE/BSE signal detectors
The TM3030Plus is equipped with a premium secondary electron detector and a backscattered electron detector which have been incorporated in FE-SEM or VP-SEM. Note: The TM3030 has a backscattered electron detector only.
These detectors can be operated effectively under low-vacuum conditions and can conduct both SE and BSE image observation without metal coating.
Premium BSE image
Both the TM3030 and TM3030Plus feature a BSE detector with 4 independent segments. By adding or subtracting signals from segments in different combinations, it is possible to emphasize compositional or topographic details in the image, as well as to produce shadowed images which highlight the sample from a particular direction.
Optional 3D-View software can generate three-dimensional views of the sample without sample tilting and/or alignment. It uses the 4 directional surface profiles from the signals acquired with each segment of the 4-segment backscattered electron detector.
5. Large specimen handling
The large specimen stage allows the mounting of a specimen up to 70mm in diameter and 50mm thick. XY specimen motion 35mm.