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Stress Plus software for polycrystalline coatings

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Code: #24771

Supplier: Malvern Panalytical Ltd

Stress analysis in polycrystalline coatings.

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  • Malvern Panalytical's Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both single-directional and multi-directional techniques. Stress Plus is an optional module for Malvern Panalytical’s Stress software, sharing its key features.

  • Measurement systems
    The following systems can be used for collecting and storing stress data:
    - Empyrean with Data Collector 4.0 and higher
    - X’Pert PRO with X’Pert Data Collector 1.3 or 2.0 and higher
    - X’Pert³ with the latest version of Data Collector 4.3 and higher
     
    Recommended system configuration
    - Designed for and running on Windows 8.1 (64-bit) and Windows 10 (64-bit) Current Branch for Business operating systems.
    - A PC configuration matching the (minimum) hardware requirements for the desired Windows operation system will be sufficient.

 

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