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Residual stress analysis software

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Code: #24770

Supplier: Malvern Panalytical Ltd

Residual stress analysis using X-ray diffraction.


  • Malvern Panalytical's Stress software is dedicated to X-ray diffraction (XRD) analysis of residual stress. Values are calculated according to the well-known single-{hkl} sin²ψ method. User-configurable defaults and instant recalculation of results based on a change of input parameters make Stress ideal for both routine analysis and research applications.

  • Measurement systems
    The following systems can be used for collecting and storing stress data:
    - Empyrean with Data Collector 4.0 and higher
    - X’Pert PRO with X’Pert Data Collector 1.3 or 2.0 and higher
    - X’Pert³ with the latest version of Data Collector 4.3 and higher
    Recommended system configuration
    - Designed for and running on Windows 8.1 (64-bit) and Windows 10 (64-bit) Current Branch for Business operating systems.
    - A PC configuration matching the (minimum) hardware requirements for the desired Windows operation system will be sufficient.