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Steady-State ThermoReflectance Fiberoptics

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Code: #30036

Supplier: LMS Technologies Pte Ltd

Steady-State ThermoReflectance Fiberoptics

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  • The SSTR-F system measures thermal conductivity using the combination of laser based thermo-reflectance techniques with traditional steady-state thermal testing concepts using the Hopkins Analysis. The technique works in principle by inducing a steady-state temperature rise in a material via long enough exposure to heating from a pump laser. A probe beam is then used to detect the resulting change in reflectance, which is proportional to the change in temperature at the sample surface. Fourier’s law is used to determine the thermal conductivity. For expanded capabilities, the system can be upgraded to measure thermal conductance and heat capacity of ultra-thin films coatings down to a few nm thick.

  • - Absolute measurement of thermal conductivity
    - Thin films and coatings (> 1 micron)
    - Effective boundary resistance (thickness < 1 micron)
    - Auto-scanning for thermal conductivity mapping
    - No inputs (i.e. heat capacity)
    - Upgradeable for thin films and coatings (> 5 nm)
    - Thermal Boundary Resistances

 

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