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Schottky Field Emission Scanning Electron Microscope SU5000

☆☆☆☆☆ ( 0 rates ) 390

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Code: #16587

A scanning electron microscope is a tool that can be used in a wide variety of fields such as nanotechnology, materials, medicine and life sciences.

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● Incorporates the newly developed user interface EM Wizard, which provides every type of user with good levels of high resolution, repeatability and throughput
● Incorporates an automatic axis adjustment technology (auto-calibration) that can restore the microscope to its "best condition" state whenever necessary
● Designed to reduce as much as possible any limits as regards the observation sample, and employs a "draw out" specimen chamber that is compatible with
large specimens(-200 mmφ, -80 mmH)
● The time required from the start of evacuation until making an observation is within 3 minutes of the maximum level for field emission scanning electron microscopes

Items		Description
Spatial Resolution		1.2 nm @ 30 kV 3.0 nm @ 1 kV 2.0 nm @ 1 kV with deceleration mode^1 3.0 nm @ 15 kV Variable Pressure mode^2
Magnification		10 - 600,000x (based on 4 "x 5 "picture), 18 - 1,000,000x (800×600 pixels on display) / 30 - 1,500,000x (1,280x960 pixels on display)
Electron Optics	Emitter	ZrO /W Schottky emitter
	Acceleration Voltage	0.5 - 30 kV (0.1 kV step)
	Landing Voltage	0.1 - 2.0 kV with deceleration mode^＊¹
	Maximum Probe Current	>200 nA
Detector		Evehart Thonley SE detector(Lower detector)
Variable Pressure Mode^*2		Pressure Range : 10 - 300 Pa
Traverse range	Control	5-Axis motorized stage
	Movement	X：0～100mm Y：0～50mm Z：3～65mm T：-20～90° R：360°
	Specimen Size	up to 200 mmΦ、maximum 80 mm height
Optional Detectors		· Top detector for high resolution imaging Through-the-Lens^2 · Ultra Variable-Pressure Detector (UVD) · Retractable five segment Backscatter Electron Detector (PD-BSD)^3 · Energy Dispersive X-ray detector (EDS) · Wavelength Dispersive X-ray detector (WDS) · Electron Backscatterd Diffraction Pattern detector (EBSD)

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