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Jasco Near-field Optical Microspectrometer

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Code: #14408

Supplier: JASCO International Co., Ltd.

The NFS Series of scanning near-field optical microspectrometers have been optimized as a new solution for nanotechnology applications. Traditionally, characterization methods on the nanometer scale consist of topography observation using an electron or scanning probe microscope or elemental analysis using an x-ray microanalyzer.

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rightMORE INFORMATION

  • - Integrated scanning near-field microspectrometer systems.
    - Spectroscopic measurements with spatial resolutions between a hundred to several hundred nm.
    - JASCO near-field probes provide reproducible spectral measurements and are available with specified dimensions.
    - Topographical measurement of sample features with simultaneous spectral measurements.
    - Can support illumination-collection, collection, and illumination (transmission) modes.

  • Model

    NFS-330/230

    NFS-300FT/200FT

    Measurement modes

    Illumination-collection, collection, and illumination (transmission)

    Illumination-collection, collection, and illumination (transmission)

    Integrated laser

    Green laser (532 nm)

    Green laser (532 nm)

    Spectrometer

    Czerny-Turner aberration-corrected spectrograph

    Fourier Transform spectrometer

    Wavelength range

    500 - 1000 nm

    850 - 1500 nm

    Detector

    CCD

    InGaAs

 

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