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Horiba XGT-7200 X-ray Analytical Microscope

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Code: #14422

Supplier: HORIBA, Ltd.

The XGT-7200 represents a completely new generation of XRF microscope, and leads the way to a new era of science. It offers a seamless merger between optical observation and elemental analysis functions, revolutionizing the world of micro-analysis and establishing micro-XRF as a routine tool for the research and analytical scientist.

rightMORE INFORMATION

  • Highest spatial resolution:
    The unique x-ray guide tube technology of HORIBA provides the highest spatial resolution micro-XRF analysis, with x-ray beam diameters down to 10 µm. The high intensity, ultra-narrow beams provided by the guide tubes allow fast, non-destructive analysis of microscopic features
    Transmission X-ray Mapped Imaging:
    In combination with XRF imaging, the XGT-7200 allows transmitted X-ray images to be acquired. This can be used to perform internal structural analyses and identify regions of interest not visible to the eye. Scanning is done with a narrow perpendicular beam, resulting in clear penetrating images even for non-flat samples such as cylindrical parts.
    Dual Vacuum Modes:
    The XGT-7200 system offers the user unique Dual Vacuum Modes for sample analysis – switching between the two modes takes just a few seconds. In Full Vacuum Mode the entire sample chamber is subjected to vacuum conditions to ensure the ultimate sensitivity to light elements. In Partial Vacuum Mode the sample is maintained at atmospheric pressure whilst a vacuum is drawn around the detector and capillary optics. This mode is ideally suited for analysis of water containing samples such as biological tissue, and fragile archaeological/museum objects.
    Complete range of sample sizes:
    The accommodating sample chamber enables a wide range of samples to be analyzed, from a 10 µm spot analysis on a microscopic feature, to mapped analysis of areas as large as 10cm x 10cm.
    Integrated Data Acquisition and Analysis Software:
    Intuitive software allows easy control of instrument hardware, fast sample visualization and selection of measurement region, and full data analysis. Functions include automated peak identification, quantitative measurements, RGB composite image generation, line profile analysis.

  • Elements

    Na to U

    X-ray tube

    Rh target / Tube voltage 50kV / Tube current 1mA

    Fluorescent X-ray detector

    Peltier cooled Silicon Drift Detector (SDD)

    Transmitted X-ray detector

    Nai(Tl) scintilltor

    X-ray guide tube

    Mono capillary 10μm / 100μm with no filter

    Optical image

    Full sample optical image and coaxial magnification image

    Sample stage size

    XY : 100mm×100mm

    Sample chamber

    Vacuum chamber model/ Max 300mm×300mm×80mm in vacuum

    Signal processing

    Digital pulse processor ( INCA unit )

    Qualitative analysis

    Auto identification / KLM marker / Peak search / Compare spectrum

    Quantitative analysis

    Non standard FPM / Standard FPM / Standard file matching FPM /Calibration curve / Multi layer FPM (Thickness gage) /Multi point analysis (Max5000) / Multi point result send to Excel / XGT-5000 spectrum view

    Mapping function

    Transmitted X-ray image / Elemental image / Spectrum mapping / Rectangle mapping / Generate spectrum / RGB composition / Scale maker / Line analysis

    Other function

    Possible to start the XGT-5200 software simultaneously.

 
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